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Effect of Series Resistance to the Measurement of Ac Loss by New Three Terminal Electrode System
Tetsuro Tokoro, Member (Gifu National College of Technology)
Masayuki Nagao, Member & Masamitsu Kosaki, Member (Toyohashi University of Technology)

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‚QDV“d‹ÉŒn‚Æ‚»‚Ì“™‰¿‰ñ˜H
V“d‹ÉŒn‚Æ‚»‚Ì“™‰¿‰ñ˜H‚ð}‚P‚ÉŽ¦‚·BH‚Í‚ˆ³“d‹ÉAM‚ÍŽå“d‹ÉAG‚̓K[ƒh“d‹É‚Å‚ ‚èARHCRGCRM‚Íö’…“d‹É•”•ª‚Ì’ïRE‘ª’èŒn‚ȂǂɊ֌W‚µ‚½AŠe“d‹É‚É’¼—ñ‚É‘¶Ý‚·‚é’ïR•ª‚Å‚ ‚éBG‚¨‚æ‚ÑC‚ÍŽŽ—¿ƒtƒBƒ‹ƒ€‚ÌŠe•½s•½”“d‹ÉŠÔ‚Ì“™‰¿•À—ñƒRƒ“ƒ_ƒNƒ^ƒ“ƒX‚Æ—e—ʂł ‚éBV“d‹ÉŒnŽŽ—¿‚Å‚ÍA]—ˆ“d‹ÉŒn‚É”ä‚ׂÄGMŠÔ‚ÌGGM‚ÆCGM‚ªV‚½‚ɉÁ‚í‚Á‚Ä‚¢‚邱‚ƂɂȂéB“™‰¿‰ñ˜H‚É‚¨‚¢‚ÄAVH, VG, VM, IH, IG, IM‚Í‚»‚ꂼ‚ê‚Ì•”•ª‚Ì“dˆÊ‚Æ“d—¬‚ð•\‚·B•’Ê‚ÍRGCRM‚ª¬‚³‚¢‚½‚ßVG, VM‚ଂ³‚­AGMŠÔ‚ɂ͓dˆÊ·‚͂Ȃ­IGM‚Í—¬‚ê‚È‚¢B‚µ‚©‚µ‚È‚ª‚çRGCRM‚ªƒ[ƒ‚łȂ¢ê‡‚ÍVG, VM‚ª¶‚¶A—¼ŽÒ‚É“dˆÊ·VGM‚ª¶‚¸‚é‰Â”\«‚ª‚ ‚éB‚±‚Ì“dˆÊ·‚ÉŠÖŒW‚µ‚½“d—¬IGM‚ª–{—ˆ‘ª’è‚·‚ׂ«“d—¬IM' ‚ɉÁ‚í‚邱‚ƂɂȂéB
ŽŽ—¿‚Ìtand<<1Cˆó‰Á“dˆ³=E‚Æ‚µ‚ÄAŠe’l‚ð‹‚߂邯A

VGM = VG - VM
= IGRG - IMRM
àjwCHGERG - jwCHMERM@EEEEEEEEEEEEEE(1)
IGM = VGM / ZGM
àjwCGM~ ( jwCHGERG - jwCHMERM)
= - w2CGME(CHGRG - CHMRM)@EEEEEEEEEEEE(2)
ˆ‘ª’ètand = ‘¹Ž¸“d—¬ / [“d“d—¬
= [GHME - w2CGME(CHGRG - CHMRM)] / wCHME EEEEE(3)

‚ƂȂèA•ªŽq‘æ2€‚É‚æ‚Á‚Ä‘ª’ètand‚ͳ•‰—¼•ûŒü‚ɃVƒtƒg‚·‚邱‚Æ‚ª‰Â”\‚ƂȂéB㎮‚©‚çAŽå“d‹ÉEƒK[ƒh“d‹ÉŠÔ‚̃Cƒ“ƒs[ƒ_ƒ“ƒX‚É—¬‚ê‚é“d—¬IGM‚ðƒ[ƒ‚Æ‚·‚ê‚ÎA‚±‚Ì“ÁˆÙ‚ÈŒ»Û‚ÍŠÏ‘ª‚³‚ê‚È‚­‚Ȃ邱‚Æ‚ª‚í‚©‚éB

‚RDŽÀŒ±Œ‹‰Ê‚¨‚æ‚ÑŒŸ“¢
}2‚ÉRGCRM‚ðˆÓ}“I‚ɂ‚¯‚½ê‡‚ÌLDPEŽŽ—¿‚̌𗬃‰ƒ“ƒv“dˆ³‰ž“š‚ÌFFT”gŒ`‰ðÍ(2)Œ‹‰Ê‚ðŽ¦‚·Btand‚Ì“dŠEˆË‘¶«‚Í‚»‚̂܂܂ÉARGCRM‚É‚æ‚è‚»‚̃IƒtƒZƒbƒg•ª‚ª•ω»‚·‚é‚Ì‚ª‚í‚©‚éBˆÈã‚æ‚èAV“d‹ÉŒn‚ł̑ª’è‚ÉÛ‚µ‚Ä‚ÍRG , RM‚È‚ÇA“d‹É•”‚Ì’ïR‚âAGMŠÔ‚Ì—e—Ê CGM‚ð‚Å‚«‚邾‚¯¬‚³‚­‚·‚邱‚Æ‚ª•K—v‚Å‚ ‚邱‚Æ‚ª‚í‚©‚éB‚È‚¨A–{Œ¤‹†‚̈ꕔ‚Í•½¬8”N“x•¶•”ȉȊwŒ¤‹†”ïiŠî”ÕiCjj‚̉‡•‚É‚æ‚Á‚Äs‚í‚ꂽB

Fig.1

Fig.2
@@ }2 RGCRM‚ð•ω»‚³‚¹‚½ê‡‚Ì—U“d“Á«
Fig.2. Tand measurement with RG or RM.

•¶ Œ£

(1) ‰“ŽR‘¼:“dŠw˜_A, 109Šª7ŒŽ†, 311-317 (•½Œ³)
(2) Š:“d‹CŠw‰ï‘S‘‘å‰ïƒVƒ“ƒ|ƒWƒEƒ€, S.5-7, 23-26 (1994)